Title :
SPM based recording toward ultrahigh density recording with trillion bits/inch2
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fDate :
3/1/2001 12:00:00 AM
Abstract :
Nano-indentation type AFM (atomic force microscopy) based storage is presented. Particularly, I discuss the possibility of ultrahigh density storage using nano-writing bits with a diameter of tens nanometers for 1 trillion bits/in2, high speed readout at over megahertz, and inner-division type nano-tracking
Keywords :
atomic force microscopy; indentation; magnetic recording; atomic force microscopy; magnetic recording; nano-indentation; scanning probe microscopy; ultrahigh density storage; Atomic force microscopy; Heating; High speed optical techniques; Magnetic force microscopy; Magnetic recording; Optical films; Optical microscopy; Optical recording; Scanning probe microscopy; Writing;
Journal_Title :
Magnetics, IEEE Transactions on
