• DocumentCode
    1467800
  • Title

    Modeling of a short-term stability measuring system of quartz crystal resonators

  • Author

    Sthal, Fabrice ; Mourey, Marc

  • Author_Institution
    Ecole Nat. Superieure de Mecanique et des Microtechniques, Besancon, France
  • Volume
    46
  • Issue
    1
  • fYear
    1999
  • Firstpage
    182
  • Lastpage
    187
  • Abstract
    A new numerical model of a short-term stability measuring system of quartz crystal resonators is presented. It is based on the phase bridge method using a pair of resonators driven by a low-noise source. The output signal, obtained with a phase detector, is proportional to the phase difference introduced by the resonators. The numerical transfer function of each bridge path is given by the model. The output spectral density of the phase fluctuations is computed from these transfer functions and the numerical approximation of the low-noise source. The model was applied to third overtone, SC-cut, 10 MHz BVA quartz crystal resonators. It enables the rejection of the source noise versus the resonant frequency of quartz crystal resonators to be quantified.
  • Keywords
    crystal resonators; electric noise measurement; phase noise; quartz; transfer functions; 10 MHz; SiO/sub 2/; numerical model; phase bridge; phase detector; phase fluctuations; phase noise; quartz crystal resonator; short-term stability measuring system; spectral density; transfer function; Acoustic measurements; Acoustic noise; Bridges; Noise measurement; Numerical models; Phase measurement; Phase noise; Resonant frequency; Stability; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.741531
  • Filename
    741531