Title :
BIST for D/A and A/D converters
Author :
Arabi, Karim ; Kaminska, Bozena ; Rzeszut, Janusz
Author_Institution :
Dept. of Electr. & Comput. Eng., Ecole Polytech., Montreal, Que., Canada
Abstract :
The expense of specialized equipment can be a problem in testing high resolution D/A converters. A BIST alternative that tests offset voltage, integral nonlinearity, differential nonlinearity, and gain error without such equipment or the use of a digital signal processor or microcontroller shows promise. We also extend the same technique to test a wide range of A/D converters
Keywords :
analogue-digital conversion; built-in self test; digital-analogue conversion; electric potential; A/D converters; BIST; D/A converters; differential nonlinearity; gain error; integral nonlinearity; offset voltage; Analog circuits; Analog-digital conversion; Automatic testing; Built-in self-test; Circuit testing; Costs; Logic testing; Manufacturing; Microcontrollers; Voltage;
Journal_Title :
Design & Test of Computers, IEEE
