• DocumentCode
    1468035
  • Title

    Parameter compatibility relations for accelerated testing

  • Author

    Rajogopal, A.K. ; Teitler, S.

  • Author_Institution
    US Naval Res. Lab., Washington, DC, USA
  • Volume
    39
  • Issue
    1
  • fYear
    1990
  • fDate
    4/1/1990 12:00:00 AM
  • Firstpage
    110
  • Lastpage
    113
  • Abstract
    It is pointed out that the use of acceleration studies implies that stress does not change the mechanisms of failure but only contracts the time to reach failure level. This implication is translated into a requirement that the parameter set for the failure distribution does not change, but values of the parameters may. The generality of the relationship between parameter values at various stress levels and the time transformation that connects the respective distributions is emphasized. These are termed compatibility relations. An example of compatibility relations for acceleration studies described by a Weibull distribution is given in detail. The compatibility relations between the coefficients in the time transformation in acceleration studies based on exponential, gamma, log-normal, and Weibull distributions and respective parameter values are discussed generally. Compatibility relations can be used to improve estimation procedures, check the consistency of parameter estimation during analysis of acceleration test data, and check the validity of the use of acceleration studies in the first place
  • Keywords
    failure analysis; life testing; parameter estimation; reliability theory; statistical analysis; Weibull distribution; accelerated testing; exponential distribution; failure distribution; gamma distribution; log-normal distribution; parameter compatibility relations; parameter estimation; reliability; stress levels; time transformation; Acceleration; Failure analysis; Laboratories; Life estimation; Parametric statistics; Shape; Statistical distributions; Stress measurement; Testing; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.52621
  • Filename
    52621