Title :
Comparative Study on Energy-Efficiencies of Single-Electron Transistor-Based Binary Full Adders Including Nonideal Effects
Author :
Lee, Jieun ; Lee, Jung Han ; Chung, In-Young ; Kim, Chang-Joon ; Park, Byung-Gook ; Kim, Dong Myong ; Kim, Dae Hwan
Author_Institution :
Sch. of Electr. Eng., Kookmin Univ., Seoul, South Korea
Abstract :
Performances and energy efficiencies of various single-electron transistor-based (SET-based) binary full adders (FAs) are comparatively investigated with optimization of device parameters by means of simulation program with integrated circuit emphasis models including nonideal effects commonly observed in really implemented SETs. The proposed binary decision diagram (BDD) cell-based 1-bit FA is the most promising in terms of energy efficiency (τ=0.3 aJ/state), power dissipation (P = 1.2 nW), delay (τ=20 ps), and immunity to process variations (background charge noise ΔQ0 <; ±0.112q and control gate capacitance mismatch ΔCcg <; 0.5 × Ccg) at the expense of hardware burden, compared with majority gate-based SET FAs (3.988 aJ/state, P = 15.95nW, τ=52 ps, ΔQ0 <; ±0.0392q, ΔCcg <; 0.35 × Ccg) and SET threshold logic gate-based FAs (3.845 aJ/state, P=15.38nW, τ=107 ps, ΔQ0 <; ±0.028q, ΔCcg <; 0.2 × Ccg). It is also found that the SET itself dominates the power dissipation in SET-based FAs and the static dc power plays a significant role in power consumption in SET-based FAs, compared with the dynamic power, regardless of the FA type. In addition, SET-based BDD FAs are compared with their CMOS counterparts.
Keywords :
adders; binary decision diagrams; single electron transistors; SET threshold logic gate; background charge noise; binary decision diagram; binary full adders; control gate capacitance mismatch; device parameters; energy efficiency; integrated circuit emphasis models; nonideal effects; single-electron transistor; Boolean functions; Capacitance; Data structures; Integrated circuit modeling; Inverters; Logic gates; SPICE; Binary decision diagram (BDD); energy efficiency; full adders (FAs); nonideal effects; single-electron transistor (SET);
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2011.2125799