DocumentCode
1468749
Title
Role of velocity saturation in lifting pinchoff condition in long-channel MOSFET
Author
Arora, Vijay K. ; Das, M.B.
Author_Institution
Dept. of Electr. Eng., Wilkes Coll., Wilkes-Barre, PA, USA
Volume
25
Issue
13
fYear
1989
fDate
6/22/1989 12:00:00 AM
Firstpage
820
Lastpage
821
Abstract
The role of velocity saturation due to high-field mobility degradation in lifting the pinchoff condition in a long-channel MOSFET is described. The electric field on the drain end at the onset of current saturation is always extremely high leading to the velocity saturation of the carriers. This velocity saturation leads to the saturation value nsD=nsoVg´/2Vc=IDsat/q nu th W on the drain end, in contrast with the well-known pinchoff behaviour, where the carrier density is shown to vanish at the saturation point. The carrier distribution, as well as the velocity distribution as a function of the channel distance along the length of the channel, is presented.
Keywords
insulated gate field effect transistors; semiconductor device models; carrier distribution; channel distance; current saturation; distance along channel; electric field; high-field mobility degradation; long-channel MOSFET; models; pinchoff condition; role of velocity saturation; velocity distribution;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19890552
Filename
91779
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