• DocumentCode
    1468768
  • Title

    An analysis of dynamic element matching flash digital-to-analog converters

  • Author

    Stubberud, Peter ; Bruce, J.W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nevada Univ., Las Vegas, NV, USA
  • Volume
    48
  • Issue
    2
  • fYear
    2001
  • fDate
    2/1/2001 12:00:00 AM
  • Firstpage
    205
  • Lastpage
    213
  • Abstract
    Although many dynamic element matching (DEM) digital-to-analog converters (DACs) have identical architectures, analyses of DEM DACs have been specific to the DAC DEM algorithm or based on simulation results. In this paper, a commonly used flash DEM DAC architecture is analyzed. Using this analysis, a DEM DAC´s mean integral nonlinearity (INL), variance of the LNL, output signal-to-distortion ratio, output signal-to-(noise plus distortion) ratio, and spurious-free dynamic range can be calculated theoretically. These theoretical measures can be used as criteria for comparing the performance of different DEM algorithms applied to the particular flash DEM DAC architecture analyzed in this paper. As an example, two new DEM algorithms-a barrel shift network controlled by a white stochastic signal and a generalized cube interconnection network (GCN) controlled by a colored stochastic signal-are introduced and compared with two stochastic DEM algorithms: a Benes network and a GCN-both of which are controlled by a white stochastic signal-and one deterministic DEM algorithm called clock-level averaging. In the example, the performance criteria are calculated theoretically and by simulation
  • Keywords
    digital-analogue conversion; electric distortion; stochastic processes; Benes network; DAC architecture; INL variance; barrel shift network; clock-level averaging; colored stochastic signal; deterministic DEM algorithm; digital-to-analog converters; dynamic element matching; flash DAC; generalized cube interconnection network; mean integral nonlinearity; performance criteria; signal-to-distortion ratio; spurious-free dynamic range; white stochastic signal; Algorithm design and analysis; Analysis of variance; Analytical models; Digital-analog conversion; Distortion measurement; Dynamic range; Particle measurements; Performance analysis; Signal analysis; Stochastic processes;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.917792
  • Filename
    917792