DocumentCode
1468777
Title
A Holistic Self-Calibration Algorithm for
Precision Metrology Systems
Author
Hu, Chuxiong ; Zhu, Yu ; Hu, Jinchun ; Zhang, Ming ; Xu, Dengfeng
Author_Institution
Dept. of Precision Instrum. & Mechanology, Tsinghua Univ., Beijing, China
Volume
61
Issue
9
fYear
2012
Firstpage
2492
Lastpage
2500
Abstract
Self-calibration technology is an important approach with the utilization of an artifact plate with mark positions that are not precisely known to calibrate the precision metrology system. In this paper, we study the self-calibration of xy precision metrology systems and present a holistic self-calibration algorithm based on the least squares method. The proposed strategy utilizes three traditional measurement views of an artifact plate on the xy metrology stage and provides relevant symmetry, transitivity, and redundancy. The misalignment errors of all measurement views, particularly errors of the translation view, are totally determined by detailed mathematical manipulations. Consequently, a least-squares-based robust estimation law is synthesized to calculate the stage error even under the existence of random measurement noise. Computer simulation validates that the proposed method can accurately realize the stage error when there is no random measurement noise. Furthermore, the calculation accuracy of the proposed scheme under various random measurement noises is studied, and the results verify that the proposed algorithm can effectively attenuate the effects of random measurement noise. The proposed strategy, in fact, provides a well-understood solution to the xy self-calibration problem for engineers in practical applications.
Keywords
calibration; least squares approximations; noise measurement; precision engineering; computer simulation; holistic self-calibration algorithm; least-squares-based robust estimation; mathematical manipulations; misalignment errors; random measurement noise; xy precision metrology systems; xy self-calibration problem; Arrays; Calibration; Measurement uncertainty; Metrology; Noise; Noise measurement; Position measurement; $xy$ metrology system; Least squares; measurement noise; self-calibration; stage error;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2012.2187250
Filename
6168833
Link To Document