DocumentCode :
1468888
Title :
Frequency-Dependent Substrate Characterization via an Iterative Pole Search Algorithm
Author :
Demeester, Thomas ; Cauwe, Maarten ; De Zutter, Daniël
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium
Volume :
21
Issue :
4
fYear :
2011
fDate :
4/1/2011 12:00:00 AM
Firstpage :
173
Lastpage :
175
Abstract :
The characterization of frequency-dependent material properties is an important issue in nowadays high-speed interconnect design. This letter presents a practical method to determine the complex permittivity of a substrate material, by combining measurements with simulations. A rational permittivity model is determined by searching for its poles and residues using an iterative optimization method. Its accuracy is verified by comparing coplanar waveguide measurements with simulations based on the new material model.
Keywords :
iterative methods; optimisation; permittivity; search problems; substrate integrated waveguides; frequency-dependent substrate characterization; interconnect design; iterative optimization method; iterative pole search algorithm; rational permittivity model; substrate material permittivity; Conductors; Coplanar waveguides; Microstrip; Permittivity measurement; Substrates; Transmission line measurements; Characterization; dielectric; permittivity; substrate;
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2011.2109374
Filename :
5728871
Link To Document :
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