• DocumentCode
    1468946
  • Title

    Return-Path Extraction Technique for SSO Analysis of Low-Cost Wire-Bonding BGA Packages

  • Author

    Oikawa, Ryuichi ; Gope, Dipanjan ; Jandhyala, Vikram

  • Author_Institution
    Renesas Electron. Corp., Kawasaki, Japan
  • Volume
    2
  • Issue
    4
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    677
  • Lastpage
    686
  • Abstract
    A return-path decomposition method that eliminates artificial return-path discontinuities is presented. The methodology is applied to over 2 Gb/s simultaneous switching output analysis of a low-cost wire-bonding-type ball grid array package with a 32-bit double-data rate interface. The analysis is based on true transistor-level signal-power simulation and a large-scale, full-wave full 3-D boundary element method field solver package model. The simulation results suggest that in a weak return-path system, such as a wire-bonding-type package, the I/O performance is mainly dominated by the signal channel design rather than the power supply design in over 2-Gb/s region. The power supply acts as a secondary signal return path rather than as a noise source. The power supply design should be more focused on the main driver/predriver power supply noise interference in those systems.
  • Keywords
    ball grid arrays; boundary-elements methods; lead bonding; I-O performance; SSO analysis; artificial return-path discontinuity elimination; double-data rate interface; driver-predriver power supply noise interference; full-wave full 3-D boundary element method field solver package model; low-cost wire-bonding-type BGA package; low-cost wire-bonding-type ball grid array package; power supply design; return-path decomposition method; return-path extraction technique; secondary signal return path; signal channel design; simultaneous switching output analysis; true transistor-level signal-power simulation; word length 32 bit; Analytical models; Couplings; Impedance; Integrated circuit modeling; Power supplies; Scattering parameters; Silicon; Return path; simultaneous switching noise; simultaneous switching output;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2012.2187015
  • Filename
    6168864