Title :
Optoelectronic integration of polymer waveguide array and metal-semiconductor-metal photodetector through micromirror couplers
Author :
Liu, Yujie ; Lin, Lei ; Choi, Chulchae ; Bihari, Bipin ; Chen, Ray T.
Author_Institution :
Microelectron. Res. Center, Texas Univ., Austin, TX, USA
fDate :
4/1/2001 12:00:00 AM
Abstract :
We report the design and formation of a high-performance polymer waveguide array with 45/spl deg/ micromirror couplers for achieving fully embedded board-level optoelectronic interconnects. We have used Si CMOS process compatible polymer as the fabrication material, which is relatively easy to process and has low propagation loss at 850-nm wavelength, 45/spl deg/ total interior reflection (TIR) micromirror couplers fabricated within the channel waveguides provide surface-normal light coupling between the waveguide and the optoelectronic devices, thus forming a fully embedded three-dimensional optoelectronic interconnect. We have demonstrated a hybrid optoelectronic integrated system of GaAs MSM photodetector array and polymer channel waveguide array with 45/spl deg/ micromirror couplers, showing an aggregate 3-dB bandwidth of 32 GHz.
Keywords :
CMOS integrated circuits; integrated optoelectronics; metal-semiconductor-metal structures; micro-optics; mirrors; optical arrays; optical couplers; optical interconnections; optical polymers; photodetectors; silicon; 32 GHz; 45/spl deg/ micromirror couplers; 850 nm; GaAs MSM photodetector array; Si; Si CMOS process compatible polymer; channel waveguides; fabrication material; fully embedded board-level optoelectronic interconnects; hybrid optoelectronic integrated system; low propagation loss; metal-semiconductor-metal photodetector; micromirror couplers; optical design; optoelectronic devices; optoelectronic integration; polymer channel waveguide array; polymer waveguide array; surface-normal light coupling; three-dimensional optoelectronic interconnect; total interior reflection; CMOS process; Couplers; Micromirrors; Optical coupling; Optical device fabrication; Optical reflection; Optoelectronic devices; Polymers; Propagation losses; Surface waves;
Journal_Title :
Photonics Technology Letters, IEEE