DocumentCode :
1469755
Title :
A Symmetrical Model for Microwave Power AlGaAs/InGaAs pHEMTs for Switch Circuit Applications
Author :
Lin, Dong-Ming ; Huang, Chien-Chang ; Chan, Yi-Jen
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
Volume :
56
Issue :
11
fYear :
2009
Firstpage :
2638
Lastpage :
2643
Abstract :
In this paper, a nonlinear model of microwave power AlGaAs/InGaAs pseudomorphic high-electron mobility transistors (pHEMTs) for switch circuit applications is presented. The symmetrical property that allows for the interchange of the drain and the source is emphasized in the characteristic equations, preserving differentiable features to any orders for the entire bias range. Moreover, the subthreshold voltage, the gate leakage current, and the charge conservation for pHEMT device modeling are included for completeness. The model is validated by being used for a single-pole-single-throw switching circuit in a commercial simulation environment, and the harmonic and two-tone intermodulation distortion predictions (at both on and off states) are examined. The measurement data show quite good agreement with the simulation results, demonstrating the effectiveness of the proposed model.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; harmonic distortion; high electron mobility transistors; indium compounds; intermodulation distortion; leakage currents; microwave field effect transistors; microwave power transistors; microwave switches; semiconductor device models; switching circuits; AlGaAs-InGaAs; charge conservation; gate leakage current; harmonic distortion; microwave power pHEMT; microwave switches; nonlinear model; pseudomorphic high-electron mobility transistor; single-pole-single-throw switching circuit; subthreshold voltage; switch circuit applications; symmetrical model; two-tone intermodulation distortion; Circuit simulation; HEMTs; Indium gallium arsenide; MODFETs; Microwave circuits; Microwave transistors; PHEMTs; Predictive models; Switches; Switching circuits; Harmonic distortion; intermodulation distortion; microwave field-effect transistors (FETs); microwave switches; modeling;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2009.2030444
Filename :
5263009
Link To Document :
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