DocumentCode :
1469776
Title :
Second-order DFB lasers fabricated by deep UV contact lithography and GSMBE
Author :
Goarin, E. ; Bonnevie, D. ; Boulou, M.
Author_Institution :
Lab. de Marcoussis CR CGE, France
Volume :
25
Issue :
13
fYear :
1989
fDate :
6/22/1989 12:00:00 AM
Firstpage :
840
Lastpage :
841
Abstract :
DFB ridge waveguide lasers at 1.55 mu m with uniform second-order gratings defined by deep UV lithography have been realised for the first time. The lasers have been fabricated using gas source molecular beam epitaxial (GSMBE) heterostructures grown in a two-step process. The characteristics of the DFB lasers (28 mA minimum threshold current, single-mode behaviour at output power in excess of 5 mW for more than 80% of the lasers and very low dispersion (+or-0.6 nm) of the lasing wavelength) demonstrate that deep UV lithography can be successfully used for the fabrication of DFB lasers.
Keywords :
distributed feedback lasers; molecular beam epitaxial growth; photolithography; semiconductor junction lasers; 1.55 micron; 28 mA; 5 mW; DFB ridge waveguide lasers; GSMBE; characteristics; deep UV contact lithography; deep UV lithography; fabrication; gas source molecular beam epitaxy; heterostructures; lasing wavelength; low dispersion; output power; second order DFB lasers; single-mode behaviour; threshold current; two-step process; uniform second-order gratings;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19890566
Filename :
91793
Link To Document :
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