• DocumentCode
    1469776
  • Title

    Second-order DFB lasers fabricated by deep UV contact lithography and GSMBE

  • Author

    Goarin, E. ; Bonnevie, D. ; Boulou, M.

  • Author_Institution
    Lab. de Marcoussis CR CGE, France
  • Volume
    25
  • Issue
    13
  • fYear
    1989
  • fDate
    6/22/1989 12:00:00 AM
  • Firstpage
    840
  • Lastpage
    841
  • Abstract
    DFB ridge waveguide lasers at 1.55 mu m with uniform second-order gratings defined by deep UV lithography have been realised for the first time. The lasers have been fabricated using gas source molecular beam epitaxial (GSMBE) heterostructures grown in a two-step process. The characteristics of the DFB lasers (28 mA minimum threshold current, single-mode behaviour at output power in excess of 5 mW for more than 80% of the lasers and very low dispersion (+or-0.6 nm) of the lasing wavelength) demonstrate that deep UV lithography can be successfully used for the fabrication of DFB lasers.
  • Keywords
    distributed feedback lasers; molecular beam epitaxial growth; photolithography; semiconductor junction lasers; 1.55 micron; 28 mA; 5 mW; DFB ridge waveguide lasers; GSMBE; characteristics; deep UV contact lithography; deep UV lithography; fabrication; gas source molecular beam epitaxy; heterostructures; lasing wavelength; low dispersion; output power; second order DFB lasers; single-mode behaviour; threshold current; two-step process; uniform second-order gratings;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19890566
  • Filename
    91793