DocumentCode
1469789
Title
A mixed model for the determination of normalized site attenuation in OATS
Author
Trakadas, Panagiotis T. ; Capsalis, Christos N.
Author_Institution
Dept. of Electr. Eng., Nat. Tech. Univ. of Athens, Greece
Volume
43
Issue
1
fYear
2001
fDate
2/1/2001 12:00:00 AM
Firstpage
29
Lastpage
36
Abstract
Normalized site attenuation (NSA) has become the standard method for determining the adequacy of open area test sites (OATS) to perform electromagnetic interference (EMI) emission and immunity measurements. Practical experience and measurement data have shown to great extent that in cases where the hypothesis of an infinitely conducting ground plane cannot be fulfilled, the models, up to the present, are not exact. The objective of this paper is to obtain a simple but more accurate model for the measurements of several equipment under test (EUT). The model introduced is based on complex image theory, and also accounts for the near field correction factor and the contribution of Norton surface wave component (vertical electric dipoles cases, only) in a simple algebraic model. Four well-known models are compared to the one presently introduced leading to some useful results, such as the accuracy of the proposed model
Keywords
attenuation measurement; dipole antennas; earthing; electromagnetic fields; electromagnetic interference; test facilities; ANSI; EMI emission measurement; EMI immunity measurements; EUT; Norton surface wave component; OATS; algebraic model; complex image theory; electromagnetic interference; equipment under test; infinitely conducting ground plane; measurement data; mixed model; model accuracy; near field correction factor; normalized site attenuation; open area test sites; vertical electric dipoles; Antenna measurements; Area measurement; Attenuation; Dipole antennas; Electromagnetic interference; Equations; Impedance; Open area test sites; Receiving antennas; Transmitting antennas;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/15.917931
Filename
917931
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