• DocumentCode
    1469918
  • Title

    A study on stray capacitance modeling of inductors by using the finite element method

  • Author

    Yu, Qin ; Holmes, Thomas W.

  • Author_Institution
    ITT Autom. Inc., Dayton, OH, USA
  • Volume
    43
  • Issue
    1
  • fYear
    2001
  • fDate
    2/1/2001 12:00:00 AM
  • Firstpage
    88
  • Lastpage
    93
  • Abstract
    Stray capacitance modeling of an inductor is essential for its RF equivalent circuit modeling and inductor design. Stray capacitance determines an inductor´s performance and upper frequency limit. A method has been proposed for modeling the distributed stray capacitance of inductors by the finite element method and a node-to-node lumped capacitance network. The effects of wire insulation layer, ferrite core, number of segments used to model the circumference of a wire cross section, pitch and coil-to-core distances, and the capacitance between nonadjacent turns, etc., an an inductors´ self-capacitance and calculation accuracy, have all been considered. The calculated equivalent lumped stray capacitance for a rod inductor with a ferrite core is compared to that estimated from measurement. Good agreement between them has been observed
  • Keywords
    capacitance; distributed parameter networks; equivalent circuits; finite element analysis; inductors; lumped parameter networks; FEM; RF equivalent circuit modeling; calculation accuracy; coil-to-core distance; distributed stray capacitance; equivalent lumped stray capacitance; ferrite core; finite element method; inductor design; inductor performance; node-to-node lumped capacitance network; pitch distance; rod inductor; self-capacitance; stray capacitance modeling; upper frequency limit; wire cross section circumference; wire insulation layer; Automotive engineering; Capacitance measurement; Circuit noise; Equivalent circuits; Ferrites; Finite element methods; Inductors; Parasitic capacitance; Radio frequency; Wire;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.917948
  • Filename
    917948