• DocumentCode
    1470065
  • Title

    An analysis of several software defect models

  • Author

    Yu, Tze-jie ; Shen, Vincent Y. ; Dunsmore, Hubert E.

  • Author_Institution
    AT&T Bell Labs., Naperville, IL, USA
  • Volume
    14
  • Issue
    9
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    1261
  • Lastpage
    1270
  • Abstract
    Results are presented of an analysis of several defect models using data collected from two large commercial projects. Traditional models typically use either program matrices (i.e. measurements from software products) or testing time or combinations of these as independent variables. The limitations of such models have been well-documented. The models considered use the number of defects detected in the earlier phases of the development process as the independent variable. This number can be used to predict the number of defects to be detected later, even in modified software products. A strong correlation between the number of earlier defects and that of later ones was found. Using this relationship, a mathematical model was derived which may be used to estimate the number of defects remaining in software. This defect model may also be used to guide software developers in evaluating the effectiveness of the software development and testing processes
  • Keywords
    programming theory; software reliability; mathematical model; software defect models; software development; software reliability; software testing; Mathematical model; Microelectronics; Phase detection; Predictive models; Programming; Resource management; Software measurement; Software metrics; Software testing; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/32.6170
  • Filename
    6170