DocumentCode
1470065
Title
An analysis of several software defect models
Author
Yu, Tze-jie ; Shen, Vincent Y. ; Dunsmore, Hubert E.
Author_Institution
AT&T Bell Labs., Naperville, IL, USA
Volume
14
Issue
9
fYear
1988
fDate
9/1/1988 12:00:00 AM
Firstpage
1261
Lastpage
1270
Abstract
Results are presented of an analysis of several defect models using data collected from two large commercial projects. Traditional models typically use either program matrices (i.e. measurements from software products) or testing time or combinations of these as independent variables. The limitations of such models have been well-documented. The models considered use the number of defects detected in the earlier phases of the development process as the independent variable. This number can be used to predict the number of defects to be detected later, even in modified software products. A strong correlation between the number of earlier defects and that of later ones was found. Using this relationship, a mathematical model was derived which may be used to estimate the number of defects remaining in software. This defect model may also be used to guide software developers in evaluating the effectiveness of the software development and testing processes
Keywords
programming theory; software reliability; mathematical model; software defect models; software development; software reliability; software testing; Mathematical model; Microelectronics; Phase detection; Predictive models; Programming; Resource management; Software measurement; Software metrics; Software testing; Time measurement;
fLanguage
English
Journal_Title
Software Engineering, IEEE Transactions on
Publisher
ieee
ISSN
0098-5589
Type
jour
DOI
10.1109/32.6170
Filename
6170
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