Title : 
Withdrawal of "Fabrication and Properties of 
  
  Structure for Ferro
 
        
            Author : 
Xie, Dan ; Zang, Yongyuan ; Luo, Yafeng ; Ren, Tianling ; Liu, Litian
         
        
        
        
        
        
        
            Abstract : 
This paper [ibid., vol. 30, no. 5, pp. 463??465, May 2009] is withdrawn at the request of the authors. The lead author has made errors in the IEEE member grades of the coauthors and not all the coauthors have prior knowledge of the submission by the lead author.
         
        
            Keywords : 
Bismuth; Electron devices; Ferroelectric materials; Hafnium oxide; IEEE members; Information science; Microelectronics; Neodymium; Random access memory;
         
        
        
            Journal_Title : 
Electron Device Letters, IEEE
         
        
        
        
        
            DOI : 
10.1109/LED.2009.2031531