Title :
Feasibility of Stockwell transform for flaw pattern recognition in ultra sonic signals
Author :
Sudheera, K. ; Nandhitha, N.M. ; Ganesh, N.V.S.L. ; Nanekar, Parithosh ; Venkatraman, B. ; Sheela Rani, B.
Author_Institution :
Fac. of Electr. & Electron., Sathyabama Univ., Chennai, India
Abstract :
Ultrasonic Testing is the widely used NDT technique for flaw detection in thick walled weldments. It is an indirect technique and the signals are to be analyzed in order to characterize the flaw. Manual interpretation of these signals is subjective in nature and is dependent on the expertise of the individual. Hence the paradigm has shifted to automated signal analysis. In this paper a successful attempt has been made to develop a pattern among the flaws of same type without using Artificial Neural Networks. Here, the signals are analyzed with Stockwell transform and the pattern is determined. Also quantitative characterization is done with mean, standard deviation, root mean square value, peak to rms ratio.
Keywords :
flaw detection; pattern recognition; ultrasonic materials testing; welds; NDT; Stockwell transform; flaw detection; flaw pattern recognition; peak-rms ratio; root mean square value; standard deviation; thick walled weldments; ultrasonic signals; ultrasonic testing; Artificial neural networks; Carbon; Manuals; Standards; Transforms; Welding; Peak to RMS ratio; RMS; Statistical parameters; Stockwell Transform; Ultrasonic signals;
Conference_Titel :
Communications and Signal Processing (ICCSP), 2014 International Conference on
Conference_Location :
Melmaruvathur
Print_ISBN :
978-1-4799-3357-0
DOI :
10.1109/ICCSP.2014.6949987