Title :
Transverse-Mode Analysis of Red-Emitting Highly Polarized Vertical-Cavity Surface-Emitting Lasers
Author :
Weidenfeld, Susanne ; Eichfelder, Marcus ; Wiesner, Michael ; Schulz, Wolfgang-Michael ; Rosbach, R. ; Jetter, Michael ; Michler, Peter
Author_Institution :
Inst. fur Halbleiteroptik und Funktionelle Grenzflachen, Univ. of Stuttgart, Stuttgart, Germany
Abstract :
We present experimental investigations of the transverse beam profile and polarization characteristics of GaInP-based oxide-confined vertical-cavity surface-emitting lasers in dependence on the oxide aperture size, mesa size, current, and temperature. We demonstrate that these lasers with aperture diameters of less than 6 μm are required for stable fundamental-mode operation. The influence of operation current and external temperature on the mode shape is investigated. We experimentally present a highly stable linearly polarized GaInP-based microcavity laser emitting at around 655 nm, where the polarization characteristics originate from intrinsic material properties.
Keywords :
III-V semiconductors; gallium compounds; indium compounds; laser beams; laser cavity resonators; laser modes; laser stability; light polarisation; microcavity lasers; quantum well lasers; surface emitting lasers; GaInP; highly-stable linearly polarized microcavity laser; mesa size; mode shape; operation current; optical polarization; oxide aperture size; oxide-confined VCSEL; red-emitting highly polarized vertical-cavity surface-emitting lasers; stable fundamental-mode operation; transverse beam profile; transverse-mode analysis; Apertures; Laser beams; Laser modes; Optical polarization; Temperature measurement; Vertical cavity surface emitting lasers; AlGaInP; polarization; semiconductor laser; transverse modes; vertical-cavity surface-emitting laser (VCSEL);
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2011.2115233
