• DocumentCode
    1470424
  • Title

    Imbalanced Mach-Zehnder interferometer integrated in micromachined silicon substrate for pressure sensor

  • Author

    Porte, Henri ; Gorel, Véronique ; Kiryenko, Stefan ; Goedgebuer, Jean-Pierre ; Daniau, William ; Blind, Pascal

  • Author_Institution
    Lab. d´´Optique, CNRS, Besancon, France
  • Volume
    17
  • Issue
    2
  • fYear
    1999
  • fDate
    2/1/1999 12:00:00 AM
  • Firstpage
    229
  • Lastpage
    233
  • Abstract
    This paper describes an interferometric pressure sensor designed to work as a remote sensor in a coherence modulation scheme, allowing a linear phase read-out of the signal. The sensor is realized from a silicon nitride waveguide Mach-Zehnder interferometer integrated on a (100) silicon substrate, and includes a micromachined membrane below a branch of the Mach-Zehnder. The characterization is achieved by a spectral analysis and shows a nonlinear relationship between the static pressure applied to the membrane and the phase variation thus obtained. The analytical description takes into account the induced deflection of the membrane and the resulting mechanical elongation of the waveguide
  • Keywords
    Mach-Zehnder interferometers; integrated optics; micro-optics; micromachining; microsensors; optical sensors; pressure sensors; silicon; (100) silicon substrate; Si; coherence modulation scheme; imbalanced Mach-Zehnder interferometer; integrated optics; linear phase read-out; mechanical elongation; micromachined membrane; micromachined silicon substrate; nonlinear relationship; optical pressure sensor; phase variation; remote sensor; silicon nitride waveguide Mach-Zehnder; silicon nitride waveguide Mach-Zehnder interferometer; spectral analysis; static pressure; Biomembranes; Fiber nonlinear optics; Integrated optics; Nonlinear optics; Optical feedback; Optical interferometry; Optical ring resonators; Optical sensors; Optical waveguides; Silicon;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.744229
  • Filename
    744229