Title :
High precision comparison between SNS and SIS Josephson voltage standards
Author :
Jeanneret, Blaise ; Rüfenacht, Alain ; Burroughs, Charles J., Jr.
Author_Institution :
Swiss Fed. Office of Metrol., Bern-Wabern, Switzerland
fDate :
4/1/2001 12:00:00 AM
Abstract :
Recently, a new Josephson voltage standard based on a 1 V programmable chip provided by the National Institute of Standards and Technology (NIST) was implemented at the Swiss Federal Office of Metrology (OFMET). A comparison with a conventional Josephson voltage standard showed an agreement of (1.4±3.4)×10-10 at 1 V. This result demonstrates the new system is functioning properly and can be used in various types of measurements. In particular, it will be one of the key components of the Watt balance experiment (1999) at OFMET
Keywords :
Josephson effect; Zener diodes; calibration; measurement standards; superconducting arrays; superconducting junction devices; superconducting microwave devices; voltage measurement; 1 V; 1 V programmable chip; Josephson voltage standard; NIST; National Institute of Standards and Technology; OFMET; SIS Josephson voltage standards; SNS Josephson voltage standards; Swiss Federal Office of Metrology; Watt balance experiment; Calibration; Critical current; Diodes; Josephson junctions; Measurement standards; Metrology; NIST; Superconducting device noise; Superconducting devices; Voltage measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
