Title :
Interlaboratory comparison of Josephson voltage standards
Author :
Deaver, David ; Miller, William B. ; Pardo, Leonard ; Jaeger, Klaus ; Plowman, Dennis ; Hamilton, Clark A.
Author_Institution :
Fluke Corp., Everett, WA, USA
fDate :
4/1/2001 12:00:00 AM
Abstract :
An interlaboratory comparison of Josephson Voltage Standards (JVS) has been made among 16 national, industrial; and military standards laboratories in North America and one in Europe. The comparison was made at 10 V using a set of four traveling Zener reference standards. A pivot laboratory made measurements at the beginning, at the end, and at nine other times during the comparison. The measured differences and their uncertainties are reported and used to establish a table of equivalence between each participant and the pivot, and between each participant and the National Institute of Standards and Technology (NIST). All but two of the differences fall within two parts in 108
Keywords :
Josephson effect; Zener diodes; laboratories; measurement standards; military standards; transfer standards; voltage measurement; 10 V; Europe; Josephson voltage standards; NIST; National Institute of Standards and Technology; North America; industrial standards laboratories; interlaboratory comparison; measurement uncertainties; military standards laboratories; national standards laboratories; traveling Zener reference standard; Battery charge measurement; Electrical resistance measurement; Extraterrestrial measurements; Laboratories; Measurement standards; Military standards; NIST; Particle measurements; Switches; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on