Title :
Error analysis for refractive-index profile determination from near-field measurements
Author :
Helms, Jochen ; Schmidtchen, Joachim ; Schüppert, Bernd ; Petermann, Klaus
Author_Institution :
Inst. fuer Hochfrequenztech., Berlin, West Germany
fDate :
5/1/1990 12:00:00 AM
Abstract :
Refractive-index profiles of diffused optical waveguides are determined by analyzing the near-field pattern of the waveguide. For this method, a computer simulation of measurement errors due to noise, quantization, defocusing, and nonlinearity of the camera system is presented by using data of a typical camera measurement system. The simulation procedure includes signal processing of the measurement intensity profile by means of a cubic spline approximation in order to reduce the influence of the measurement system errors. The residual errors associated with this technique are on the order of a few percent when measuring typical Ti:LiNbO3 waveguides
Keywords :
cameras; measurement errors; noise; nonlinear optics; optical waveguides; refractive index measurement; LiNbO3:Ti; camera measurement system; camera system; camera system nonlinearity; computer simulation; cubic spline approximation; defocusing; diffused optical waveguides; measurement errors; measurement intensity profile; near-field measurements; near-field pattern; noise; quantization; refractive-index profile determination; signal processing; Cameras; Computer simulation; Error analysis; Measurement errors; Optical noise; Optical refraction; Optical signal processing; Optical waveguides; Pattern analysis; Quantization;
Journal_Title :
Lightwave Technology, Journal of
