Novel MMIC source-impedance tuners for on-wafer microwave noise-parameter measurements

Author

McIntosh, Caroline E. ; Pollard, Roger D. ; Miles, Robert E.

Author_Institution

Sch. of Electron. & Electr. Eng., Leeds Univ., UK

Volume

47

Issue

2

fYear

1999

fDate

2/1/1999 12:00:00 AM

Firstpage

125

Lastpage

131

Abstract

Novel monolithic-microwave integrated-circuit source-impedance tuners for use in on-wafer noise-parameter measurement systems are reported, which can be incorporated into a wafer probe tip. These eliminate the effect of cable and probe losses on the magnitude of a reflection coefficient that can be presented to the input of an on-wafer test device, thus enabling higher magnitudes to be synthesized than for conventional tuners, and with the potential of increasing noise-parameter measurement accuracy

Keywords

HEMT integrated circuits; MMIC phase shifters; circuit tuning; electric noise measurement; field effect MMIC; field effect transistor switches; microwave reflectometry; network analysers; MMIC source-impedance tuners; PHEMT switches; Smith chart; noise-parameter measurement accuracy; on-wafer microwave noise-parameter measurement; on-wafer test device input; reflection coefficient; two-port parameters; variable impedance state; wafer probe tip; Impedance; Integrated circuit noise; Loss measurement; MMICs; Microwave measurements; Noise measurement; PHEMTs; Probes; Switches; Tuners;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.744286

Filename

744286