Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ω resistor

Author

Satrapinski, Alexandre ; Seppä, Hekki ; Schumacher, Bernd ; Warnecke, Peter ; Delahaye, François ; Poirier, Wilfrid ; Piquemal, Françoise

Author_Institution

Center for Metrol. & Accreditation, Espoo, Finland

Volume

50

Issue

2

fYear

2001

fDate

4/1/2001 12:00:00 AM

Firstpage

238

Lastpage

241

Abstract

We have carried out a resistance comparison of four QHR systems using a 100-Ω resistor in a temperature-controlled and hermetically sealed enclosure, the comparison was performed in November and December 1998, the participants were Bureau International des Poids et Mesures (BIPM), Bureau National de Metrology-Laboratoire Central des Industries Electroniques (BNM-LCIE) France, Physikalisch-Technische Bundesanstalt (PTB) Germany, and Valtion Teknillinen Tutkimuskeskus (VTT Automation) Finland, acting as a pilot laboratory. The comparison results agree within 3 parts in 10⁹ with a relative combined standard uncertainty of ±1×10^-8

Keywords

bridge circuits; electric resistance measurement; quantum Hall effect; resistors; transfer standards; 100 ohm; CCC resistance bridge; hermetically sealed enclosure; pressure stabilized resistor; quantum Hall resistance systems; relative combined standard uncertainty; temperature stabilized resistor; temperature-controlled enclosure; transfer standards comparison; Air transportation; Automation; Electrical resistance measurement; Hermetic seals; Laboratories; Measurement standards; Resistors; Temperature control; Temperature dependence; Thermal resistance;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.918111

Filename

918111