Title :
Traceability of the 10-kΩ standard at IEN
Author :
Boella, Giorgio ; Capra, Pier Paolo ; Cassiago, Cristina ; Cerri, Roberto ; Reedtz, Giancarlo Marullo ; Sosso, Andrea
Author_Institution :
Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
fDate :
4/1/2001 12:00:00 AM
Abstract :
The traditional scaling method used at the Istituto Elettrotecnico Nazionale (IEN) for the calibration of the 10-kΩ standard is compared with more straightforward techniques: one based on the linearity of a DVM and the other on a commercial current comparator bridge. For the three methods, the measurement results and the uncertainty budgets are reported. The agreement is better than 1×10-7
Keywords :
bridge circuits; calibration; current comparators; digital voltmeters; electric resistance measurement; measurement standards; measurement uncertainty; quantum Hall effect; resistors; 10 kohm; DVM linearity; calibration; commercial current comparator bridge; quantum Hall resistance; resistance standard; scaling method; traceability; uncertainty budgets; Bridge circuits; Calibration; Electric resistance; Electrical resistance measurement; Linearity; Measurement standards; Resistors; Switches; Thermal resistance; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
