• DocumentCode
    1470695
  • Title

    Measurement uncertainties arising from unpowered shipment of dc voltage references

  • Author

    Christian, Laurie A. ; Chua, Sze Wey ; Sim, Tian Yeong ; Liu, Ling Xiang

  • Author_Institution
    Nat. Meas. Centre, Singapore Production & Standards Board, Singapore
  • Volume
    50
  • Issue
    2
  • fYear
    2001
  • fDate
    4/1/2001 12:00:00 AM
  • Firstpage
    259
  • Lastpage
    262
  • Abstract
    We have measured the hysteresis in output voltage arising from loss of power for three Fluke 732B dc voltage references. Continuously powering the internal temperature-controlled oven provides the best accuracy with such Zener-diode-based dc voltage references. Batteries are used to provide power continuity when shipping between laboratories. We have shown that for these particular instruments, an apparent hysteresis induced by humidity is likely to dominate any hysteresis arising from loss of battery power when transit between laboratories takes three days or more. Our conclusion is that as much, if not more, care needs to be taken when dealing with humidity than with loss of battery power when shipping between laboratories. When the highest accuracy of dc voltage comparison is required, it becomes necessary to apply voltage corrections using the measured values of humidity coefficients and the relative humidity occurring during transit
  • Keywords
    Zener diodes; environmental factors; hysteresis; measurement uncertainty; transfer standards; voltage measurement; DC voltage comparison; DC voltage references; Fluke 732B standards; Zener-diode-based standards; apparent hysteresis; humidity induced hysteresis; loss of power; measurement uncertainties; output voltage hysteresis; power continuity; unpowered shipment; voltage corrections; Battery charge measurement; Humidity; Hysteresis; Instruments; Laboratories; Loss measurement; Measurement uncertainty; Ovens; Power measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.918116
  • Filename
    918116