Title :
Logic synthesis of multilevel circuits with concurrent error detection
Author :
Touba, Nur A. ; McCluskey, Edward J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
fDate :
7/1/1997 12:00:00 AM
Abstract :
This paper presents a procedure for synthesizing multilevel circuits with concurrent error detection. All errors caused by single stuck-at faults are detected using a parity-check code. The synthesis procedure (implemented in Stanford CRCs TOPS synthesis system) fully automates the design process, and reduces the cost of concurrent error detection compared with previous methods. An algorithm for selecting a good parity-check code for encoding the circuit outputs is described. Once the code has been selected, a new procedure called structure-constrained logic optimization is used to minimize the area of the circuit as much as possible while still using a circuit structure that ensures that single stuck-at faults cannot produce undetected errors. It is proven that the resulting implementation is path fault secure, and when augmented by a checker, forms a self-checking circuit. The actual layout areas required for self-checking implementations of benchmark circuits generated with the techniques described in this paper are compared with implementations using Berger codes, single-bit parity, and duplicate-and-compare. Results indicate that the self-checking multilevel circuits generated with the procedure described here are significantly more economical
Keywords :
circuit CAD; circuit optimisation; error detection; integrated circuit testing; integrated logic circuits; logic CAD; logic testing; multivalued logic circuits; Stanford CRCs TOPS synthesis system; concurrent error detection; logic synthesis; multilevel circuits; parity-check code; path fault secure; self-checking circuit; single stuck-at faults; structure-constrained logic optimization; Circuit faults; Circuit synthesis; Costs; Cyclic redundancy check; Electrical fault detection; Encoding; Fault detection; Logic circuits; Parity check codes; Process design;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on