• DocumentCode
    1470785
  • Title

    Development of a split-toroid high-temperature superconducting cryogenic current comparator

  • Author

    Early, Murray D. ; Jones, Keith ; Staines, Mike P. ; Exley, Ross R.

  • Author_Institution
    Meas. Standards Lab. of New Zealand, Ind. Res. Ltd., Lower Hutt, New Zealand
  • Volume
    50
  • Issue
    2
  • fYear
    2001
  • fDate
    4/1/2001 12:00:00 AM
  • Firstpage
    306
  • Lastpage
    309
  • Abstract
    Cryogenic current comparators (CCCs) based on split toroidal shields show promise for the construction of high-accuracy ratio devices using high-temperature superconductors. To test this approach we have carried out measurements on a low-temperature superconducting prototype built of three layers of toroidal shields. We find that ratio accuracies of about 1 in 107 are achievable for this prototype. After several attempts, we were also able to construct a toroidal two-layer CCC fabricated of YBCO (YBa2Cu3O7) components using split shields. The results from measurements on this device at low temperatures (4 K) indicate that the shielding provided by these layers does not provide sufficient attenuation of the leakage flux. The challenge remains to find a processing technique to produce YBCO in a machinable form with satisfactory magnetic shielding properties
  • Keywords
    cryogenic electronics; cryogenics; current comparators; electric current measurement; high-temperature superconductors; magnetic shielding; measurement standards; YBa2Zn3O7; attenuation; cryogenic current comparators; high-accuracy ratio devices; high-temperature superconductors; leakage flux; magnetic shielding properties; processing technique; ratio accuracies; split toroidal shields; Cryogenics; Current measurement; Electrical resistance measurement; High temperature superconductors; Laboratories; Prototypes; SQUIDs; Superconducting epitaxial layers; Superconducting materials; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.918128
  • Filename
    918128