• DocumentCode
    1470786
  • Title

    Experimental characterization of a dynamically gain-flattened erbium-doped fiber amplifier

  • Author

    Lee, Y.W. ; Nilsson, J. ; Hwang, S.T. ; Kim, S.J.

  • Author_Institution
    Telecommun. R&D Center, Samsung Electron. Co., Suwon, South Korea
  • Volume
    8
  • Issue
    12
  • fYear
    1996
  • Firstpage
    1612
  • Lastpage
    1614
  • Abstract
    We have designed and experimentally characterized an erbium doped fiber amplifier (EDFA) which possesses a wavelength-independent gain spectrum, independent of the operating level of the gain (dynamic gain flatness), and without requiring any gain-level-dependent control of any parameters. In the wavelength range 1542-1552 nm, the gain was flat to within the experimental uncertainties of /spl plusmn/0.3 dB even as the gain level changed by 17 dB. The EDFA was based on a low-Al-content alumino-germanosilicate EDF and a Mach-Zehnder filter. We believe that this type of EDFA, which has not been demonstrated before, can significantly simplify the design of amplified wavelength-division multiplexing (WDM) transmission systems and increase the robustness of long-distance WDM transmission.
  • Keywords
    erbium; fibre lasers; infrared sources; laser transitions; measurement errors; optical communication equipment; optical fibre communication; optical filters; wavelength division multiplexing; 1542 to 1552 nm; Mach-Zehnder filter; amplified wavelength-division multiplexing transmission system design; dynamic gain flatness; dynamically gain-flattened erbium-doped fiber amplifier; erbium doped fiber amplifier design; experimental uncertainties; gain level; gain-level-dependent control; long-distance WDM transmission robustness; low-Al-content alumino-germanosilicate EDF; operating level; wavelength range; wavelength-independent gain spectrum; Erbium-doped fiber amplifier; Extinction ratio; Filters; Gain measurement; Optical attenuators; Probes; Research and development; Shape; Wavelength division multiplexing; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.544694
  • Filename
    544694