DocumentCode
1470811
Title
Improving SEU Fault Tolerance Capabilities of a Self-Converging Algorithm
Author
Velazco, Raoul ; Mansour, Wassim ; Pancher, Fabrice ; Marques-Costa, Greicy ; Sohier, Devan ; Bui, Alain
Author_Institution
TIMA, Grenoble, France
Volume
59
Issue
4
fYear
2012
Firstpage
818
Lastpage
823
Abstract
The single-event upset (SEU) fault tolerance of a benchmark self-converging algorithm is evaluated by fault injection campaigns performed using a devoted test platform. The number of observed errors significantly decreases depending on adopted implementation strategies.
Keywords
Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Radiation detectors; Registers; Software; Fault injection; fault tolerance; self-stabilization; single-event upset (SEU); triple modular redundancy (TMR);
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2012.2188303
Filename
6170581
Link To Document