• DocumentCode
    1470835
  • Title

    New thin-film multijunction thermal converters with negligible low frequency AC-DC transfer differences

  • Author

    Laiz, Hector ; Klonz, Manfred ; Kessler, Ernst ; Spiegel, Thomas

  • Author_Institution
    Inst. Nacional de Tecnologie Ind., San Martin, Argentina
  • Volume
    50
  • Issue
    2
  • fYear
    2001
  • fDate
    4/1/2001 12:00:00 AM
  • Firstpage
    333
  • Lastpage
    337
  • Abstract
    The AC-DC transfer differences of thin-film thermal converters at low frequencies are caused by nonlinearities in the heat transport mechanisms and in the thermal-to-electric conversion process. The resulting power coefficient of the sensitivity has been compensated by adding another nonlinear temperature sensitive component to the thermal-to-electric conversion process. This is a thin-film Ni resistor mounted under the thermocouples and connected to the output of the thermocouples. The Ni resistor together with the internal resistance of the thermocouples forms a resistive divider for the output voltage. The positive temperature coefficient of the Ni resistor in the divider compensates for the negative power coefficient of the sensitivity. As a result, converters used at a rated voltage of 1.5 V or a rated current of 7 mA have an AC-DC transfer difference below 0.3 μV/V and 0.3 μA/A respectively with a standard uncertainty of 0.3 μV/V and 0.3 μA/A respectively at a frequency of 10 Hz
  • Keywords
    compensation; convertors; thermocouples; thin film resistors; transfer standards; voltage dividers; voltage measurement; 1.5 V; 10 Hz; 7 mA; electrothermal model; heat transport mechanisms; negative power coefficient; negligible LF AC-DC transfer differences; nonlinearities; power coefficient; sensitivity; temperature coefficient; thermal-to-electric conversion process; thermocouples; thin-film multijunction thermal converters; Analog-digital conversion; Frequency conversion; Heat transfer; Resistance heating; Resistors; Temperature sensors; Thermal resistance; Thermoelectricity; Transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.918135
  • Filename
    918135