• DocumentCode
    1470975
  • Title

    A swept-field aspiration condenser as an ion-mobility spectrometer

  • Author

    Sacristán, Emilio ; Solis, Andro A.

  • Author_Institution
    Dept. of Electr. Eng., Univ. Autonoma Metropolitana, Mexico City, Mexico
  • Volume
    47
  • Issue
    3
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    769
  • Lastpage
    775
  • Abstract
    A method is presented for using a small, low-cost, extremely simple device as an ion-mobility spectrometer. The device is a planar first-order differential aspiration condenser as described by Puumalainen, but in this case the electric field is not kept constant but is swept in discrete nonuniform steps. The result is a characteristic I(V) curve that is a function of the ion-mobility density function of the gas sample flowing through the condenser. A discrete transform is introduced, based on the equations of Tammet describing the operation of aspiration condensers, that converts the I(V) curve into the ion-mobility density spectrum and vice versa. Both the device and the method are described in theoretical detail. The method is illustrated with computer simulations and experimental data using both a prototype aspiration condenser and a conventional drift tube ion-mobility spectrometer. The results suggest this method is an attractive alternative for ion-mobility gas analysis applications
  • Keywords
    ion microanalysis; ion mobility; spectrometers; Tammet equation; computer simulation; gas analysis; ion mobility spectrometer; swept-field aspiration condenser; Chemistry; Costs; Discrete transforms; Gases; Instruments; Ionizing radiation; Nonuniform electric fields; Pollution measurement; Spectroscopy; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.744345
  • Filename
    744345