• DocumentCode
    1471039
  • Title

    VHDL modeling and model testing for DSP applications

  • Author

    Armstrong, James R. ; Gray, F. Gail ; Lin, Meng-Wei

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    46
  • Issue
    1
  • fYear
    1999
  • fDate
    2/1/1999 12:00:00 AM
  • Firstpage
    13
  • Lastpage
    22
  • Abstract
    The use of hardware description language models is now central to the digital design process. These models represent the initial interpretation of the specification. They are also used as input to synthesis tools in the application-specific integrated circuit design process central to the development of digital signal processor circuits. In this paper, the use of high-level graphics-based modeling tools is advocated to relieve the modeler of the burden of hand coding the models. A similar approach is advocated for developing test benches that test the models. Models and test benches are refined in a library structure. Environmental data generators are used to prepare test files to be read by the test benches. The test benches are linked directly to the specification and test plans control the test bench configuration. This approach is applied to infrared search and track and synthetic aperture radar systems
  • Keywords
    application specific integrated circuits; digital integrated circuits; digital signal processing chips; engineering graphics; hardware description languages; integrated circuit design; optical tracking; synthetic aperture radar; ASIC design; DSP applications; VHDL modeling; application-specific integrated circuit; digital design process; digital signal processing; environmental data generators; graphics based design tools; hardware description language models; high-level graphics-based modeling tools; infrared search and track; model testing; synthesis tools; synthetic aperture radar systems; test benches; test files; Application specific integrated circuits; Circuit testing; Digital signal processing; Digital signal processors; Hardware design languages; Integrated circuit synthesis; Process design; Signal design; Signal synthesis; Software libraries;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/41.744371
  • Filename
    744371