DocumentCode
1471194
Title
Design of a hardware accelerator for real-time moment computation: a wavefront away approach
Author
Hung, Donald L. ; Cheng, Heng-da ; Sengkhamyong, Savang
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Richland, WA, USA
Volume
46
Issue
1
fYear
1999
fDate
2/1/1999 12:00:00 AM
Firstpage
207
Lastpage
218
Abstract
In image processing, pattern recognition, and computer vision, one of the most powerful techniques for feature extraction is to use moments. Real-time applications of this method, however, have been prohibited due to the intensive computation encountered in calculating the moments. One solution to this problem is to adopt specially designed hardware accelerators. This paper describes, from a practical standpoint, the design of a custom hardware accelerator for speeding up the moment computation. The design of the core functional units and the design of the overall system based on a wavefront array architecture are discussed. The moment accelerator can be easily configured into different sizes to meet diverse application requirements cost effectively. Testing results based on implementation using field-programmable gate array devices show that, at an affordable cost, the proposed hardware accelerator can deliver real-time speeds for moment computation. Elimination of this computational bottleneck makes it possible to use moments-based features in real-time industrial applications
Keywords
feature extraction; field programmable gate arrays; logic design; parallel processing; computer vision; core functional units design; custom hardware accelerator; feature extraction; field-programmable gate array devices; hardware accelerator design; image processing; parallel processing; pattern recognition; real-time industrial applications; real-time moment computation; wavefront away approach; Application software; Computer architecture; Computer vision; Costs; Feature extraction; Field programmable gate arrays; Hardware; Image processing; Pattern recognition; Testing;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/41.744413
Filename
744413
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