DocumentCode :
1471332
Title :
Density comparison measurement of silicon by pressure of flotation method
Author :
Waseda, Atsushi ; Fujii, K.
Author_Institution :
Nat. Res. Lab. of Metrol., Ibaraki, Japan
Volume :
50
Issue :
2
fYear :
2001
fDate :
4/1/2001 12:00:00 AM
Firstpage :
604
Lastpage :
607
Abstract :
We have developed a new density comparison measurement system for silicon crystals using the pressure of flotation method to evaluate the consistency in the absolute densities and to study defect and impurity effects on silicon single crystals. We have carried out density comparison measurements for the density standard and Avogadro constant silicon spheres of the NRLM, Ibaraki, Japan. We have calculated the adjusted densities from our comparison and absolute measurements based on a least-squares analysis using a matrix formulation
Keywords :
constants; density measurement; measurement standards; silicon; Avogadro constant silicon spheres; Si; absolute densities; density comparison measurement system; density effects; density standard; impurity effects; least-squares analysis; matrix formulation; molar volume; pressure of flotation method; silicon single crystals; Crystals; Density measurement; Impurities; Laboratories; Metrology; Pressure control; Pressure measurement; Silicon; Solids; Temperature;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.918202
Filename :
918202
Link To Document :
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