A Bragg silicon lattice comparator

Author

Alasia, Franco ; Basile, Giuseppe ; Becker, P. ; Kuetgens, U. ; Stuempel, J. ; Servidori, Marco ; Härtwig, Jürgen

Author_Institution

Istituto di Metrologia, CNR, Torino, Italy

Volume

50

Issue

2

fYear

2001

fDate

4/1/2001 12:00:00 AM

Firstpage

608

Lastpage

611

Abstract

The basic principle and the results of the feasibility study of a Bragg lattice parameter comparator, developed within the framework of the Standards, Measurements, and Testing European Project silicon for mass unit and standard (SIMUS) are described. It combines a Bragg lattice comparator (Hart-Hausermann design) and an X-ray angle interferometer to determine the angular position of diffraction peaks. Comparisons between Si crystals with a relative uncertainty of 1×10^-8 are expected

Keywords

X-ray apparatus; X-ray diffraction; constants; electromagnetic wave interferometers; goniometers; lattice constants; mass measurement; measurement standards; silicon; synchrotron radiation; Avogadro constant; Bragg lattice parameter comparator; Hart-Hausermann design; SIMUS project; Si; X-ray angle interferometer; angular position; diffraction peaks; goniometer; mass standard; mass unit; relative uncertainty; synchrotron radiation; Crystals; Geometry; Helium; Lattices; Measurement standards; Silicon; Standards development; Synchrotron radiation; Testing; X-ray diffraction;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.918203

Filename

918203