Title :
A Bragg silicon lattice comparator
Author :
Alasia, Franco ; Basile, Giuseppe ; Becker, P. ; Kuetgens, U. ; Stuempel, J. ; Servidori, Marco ; Härtwig, Jürgen
Author_Institution :
Istituto di Metrologia, CNR, Torino, Italy
fDate :
4/1/2001 12:00:00 AM
Abstract :
The basic principle and the results of the feasibility study of a Bragg lattice parameter comparator, developed within the framework of the Standards, Measurements, and Testing European Project silicon for mass unit and standard (SIMUS) are described. It combines a Bragg lattice comparator (Hart-Hausermann design) and an X-ray angle interferometer to determine the angular position of diffraction peaks. Comparisons between Si crystals with a relative uncertainty of 1×10-8 are expected
Keywords :
X-ray apparatus; X-ray diffraction; constants; electromagnetic wave interferometers; goniometers; lattice constants; mass measurement; measurement standards; silicon; synchrotron radiation; Avogadro constant; Bragg lattice parameter comparator; Hart-Hausermann design; SIMUS project; Si; X-ray angle interferometer; angular position; diffraction peaks; goniometer; mass standard; mass unit; relative uncertainty; synchrotron radiation; Crystals; Geometry; Helium; Lattices; Measurement standards; Silicon; Standards development; Synchrotron radiation; Testing; X-ray diffraction;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
