A Simple Algorithm for Bayesian Signal Analysis With Applications to Metrology

A Bayesian approach to spectrum analysis using approximations based on the posterior mode is applied here to waveform metrology. A simple algorithm for obtaining accurate estimates of signal parameters and their associated uncertainties is presented. It is assumed that the data can be modeled with trigonometric equations. The algorithm can be easily implemented with those commercial laboratory software packages routinely used by metrologists for controlling instrumentation and reporting measurement results. Its performance has been confirmed through several experimental setups.