Title :
The Line Spectral Frequency Model of a Finite-Length Sequence
Author :
Yedlapalli, Satya Sudhakar ; Hari, K.V.S.
Author_Institution :
Dept. of Electr. Commun. Eng., Indian Inst. of Sci. (IISc), Bangalore, India
fDate :
6/1/2010 12:00:00 AM
Abstract :
The line spectral frequency (LSF) of a causal finite length sequence is a frequency at which the spectrum of the sequence annihilates or the magnitude spectrum has a spectral null. A causal finite-length sequence with (L + 1) samples having exactly L-LSFs, is referred as an Annihilating (AH) sequence. Using some spectral properties of finite-length sequences, and some model parameters, we develop spectral decomposition structures, which are used to translate any finite-length sequence to an equivalent set of AH-sequences defined by LSFs and some complex constants. This alternate representation format of any finite-length sequence is referred as its LSF-Model. For a finite-length sequence, one can obtain multiple LSF-Models by varying the model parameters. The LSF-Model, in time domain can be used to synthesize any arbitrary causal finite-length sequence in terms of its characteristic AH-sequences. In the frequency domain, the LSF-Model can be used to obtain the spectral samples of the sequence as a linear combination of spectra of its characteristic AH-sequences. We also summarize the utility of the LSF-Model in practical discrete signal processing systems.
Keywords :
frequency-domain analysis; signal processing; time-domain analysis; annihilating sequence; arbitrary causal finite-length sequence; discrete signal processing systems; frequency domain; line spectral frequency model; spectral decomposition structures; spectral null; time domain; Annihilating (AH) sequence; Levinson–Durbin; antisymmetric; fixed-point approximation; line spectral frequency (LSF); line spectral pair (LSP); linear phase; linear prediction; minimum phase; normalized phase; roots of a polynomial; spectral decomposition; symmetric;
Journal_Title :
Selected Topics in Signal Processing, IEEE Journal of
DOI :
10.1109/JSTSP.2010.2048233