DocumentCode
1472300
Title
Pattern Run-Length for Test Data Compression
Author
Lee, Lung-Jen ; Tseng, Wang-Dauh ; Lin, Rung-Bin ; Chang, Cheng-Ho
Author_Institution
Dept. of Electron. Eng., Army Acad., Taoyuan, Taiwan
Volume
31
Issue
4
fYear
2012
fDate
4/1/2012 12:00:00 AM
Firstpage
644
Lastpage
648
Abstract
This paper presents a new pattern run-length compression method whose decompressor is simple and easy to implement. It encodes 2|n| runs of compatible or inversely compatible patterns, either inside a single test data segment or across multiple test data segments. Experimental results show that it can achieve an average compression ratio of 67.64% and considerable test application time savings.
Keywords
automatic test equipment; data compression; runlength codes; 2n pattern run length compression method; average compression ratio; decompressor; inversely compatible pattern; multiple test data segment; single test data segment; test data compression; Clocks; Decoding; Encoding; Multiplexing; Synchronization; System-on-a-chip; Test data compression; Automated test equipment (ATE); circuit under test (CUT); pattern run-length; test data compression;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2011.2176733
Filename
6171051
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