DocumentCode :
1472300
Title :
Author :
Lee, Lung-Jen ; Tseng, Wang-Dauh ; Lin, Rung-Bin ; Chang, Cheng-Ho
Author_Institution :
Dept. of Electron. Eng., Army Acad., Taoyuan, Taiwan
Volume :
31
Issue :
4
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
644
Lastpage :
648
Abstract :
This paper presents a new pattern run-length compression method whose decompressor is simple and easy to implement. It encodes 2|n| runs of compatible or inversely compatible patterns, either inside a single test data segment or across multiple test data segments. Experimental results show that it can achieve an average compression ratio of 67.64% and considerable test application time savings.
Keywords :
automatic test equipment; data compression; runlength codes; 2n pattern run length compression method; average compression ratio; decompressor; inversely compatible pattern; multiple test data segment; single test data segment; test data compression; Clocks; Decoding; Encoding; Multiplexing; Synchronization; System-on-a-chip; Test data compression; Automated test equipment (ATE); circuit under test (CUT); pattern run-length; test data compression;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2011.2176733
Filename :
6171051
Link To Document :
