• DocumentCode
    1472684
  • Title

    Automatic target recognition using enhanced resolution SAR data

  • Author

    Novak, L.M. ; Owirka, G.J. ; Weaver, A.L.

  • Author_Institution
    Lincoln Lab., MIT, Lexington, MA, USA
  • Volume
    35
  • Issue
    1
  • fYear
    1999
  • fDate
    1/1/1999 12:00:00 AM
  • Firstpage
    157
  • Lastpage
    175
  • Abstract
    Using advanced technology, a new automatic target recognition (ATR) system has been developed that provides significantly improved target recognition performance compared with ATR systems that use conventional synthetic aperture radar (SAR) image-processing techniques. This significant improvement in target recognition performance is achieved by using a new superresolution image-processing technique that enhances SAR image resolution (and image quality) prior to performing target recognition. A computationally efficient two-level implementation of a template-based classifier is used to perform target recognition. The improvement in target recognition performance achieved using superresolution image processing in this new ATR system is quantified
  • Keywords
    feature extraction; image classification; image resolution; mean square error methods; object recognition; radar computing; radar imaging; radar resolution; radar target recognition; synthetic aperture radar; MSE classifier; SAR image resolution; automatic target recognition; computationally efficient two-level implementation; depression angle sensitivity; enhanced resolution SAR data; feature extractor; image quality; near real time; recognition performance; robust false alarm mitigation; superresolution image-processing technique; template-based classifier; thresholding; visualization tools; Image processing; Image quality; Image recognition; Image resolution; Laboratories; Real time systems; Robustness; Synthetic aperture radar; Target recognition; US Government;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/7.745689
  • Filename
    745689