Title :
Fractal Power Network Based on Plant Vein for Power Integrity
Author :
Huang, Hui-Fen ; Chu, Qing-Xin ; Xiao, Jian-Kang
Author_Institution :
Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou, China
Abstract :
In this paper, a fractal power network has been proposed. The structure is designed based on leaf vein. The simulated and measured results illustrate that the designed power network has greatly improved noise isolation, resistive and inductive voltage drop, and “Swiss Cheese” effect.
Keywords :
fractals; integrated circuit interconnections; Swiss cheese effect; fractal power network; inductive voltage drop; leaf vein; noise isolation; plant vein; power integrity; Attenuation; Chromium; Circuit noise; Conductivity; Dairy products; Finite difference methods; Fractals; Noise measurement; Periodic structures; Power cables; Power measurement; Programmable control; Semiconductivity; Semiconductor device measurement; Signal processing; Tree data structures; Veins; Voltage; “Swiss cheese” effect; Fractal; power integrity (PI); voltage drop;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2010.2046643
