DocumentCode :
1472864
Title :
Thermal Phase Noise Measurements in Optical Fiber Interferometers
Author :
Bartolo, Robert E. ; Tveten, Alan B. ; Dandridge, Anthony
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
Volume :
48
Issue :
5
fYear :
2012
fDate :
5/1/2012 12:00:00 AM
Firstpage :
720
Lastpage :
727
Abstract :
We present measurement data of fundamental thermal noise in a 40-m fiber optic Mach-Zehnder interferometer (MZI) using 80-μm-diameter optical fiber. To extend the measurements to low frequencies (below 500 Hz), the experimental setup is carefully designed to minimize ambient noise, thermal drift, and the phase and amplitude noise of the lasers. These experimental results are compared with theoretical predictions for the magnitude of the fundamental thermal noise in fiber, due to both thermodynamic temperature fluctuations and spontaneous length fluctuations. The experimental data, using two different solid-state lasers with two different emission wavelengths (1319 and 1550 nm), is in reasonable agreement with both theories over frequencies ranging from 20 Hz to 100 kHz. In terms of strain resolution, this paper demonstrates a fundamental thermal noise limit of approximately one femtostrain/rt(Hz) for a 40-m fiber optic MZI.
Keywords :
Mach-Zehnder interferometers; electric noise measurement; optical fibres; phase noise; solid lasers; thermal noise; ambient noise; amplitude noise; distance 40 m; emission wavelengths; fiber optic Mach-Zehnder interferometer; frequency 20 Hz to 100 kHz; fundamental thermal noise limit; optical fiber interferometers; size 80 mum; solid-state lasers; spontaneous length fluctuations; strain resolution; thermal drift; thermal phase noise measurements; thermodynamic temperature fluctuations; wavelength 1319 nm; wavelength 1550 nm; Noise measurement; Optical fiber sensors; Optical fiber theory; Phase noise; Thermal noise; 1/f noise; interferometers; optical fiber sensors; phase noise; thermal noise;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2012.2190717
Filename :
6171816
Link To Document :
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