Minimize Production Loss in Device Testing via Condition-Based Equipment Maintenance

Author

Jin, Tongdan ; Mechehoul, Mahmoud

Author_Institution

Ingram Sch. of Eng., Texas State Univ., San Marcos, TX, USA

Volume

7

Issue

4

fYear

2010

Firstpage

958

Lastpage

963

Abstract

A condition-based maintenance program is proposed to reduce the device testing cost by utilizing tester´s self-diagnostic data. The degradation signal is modeled as a nonstationary Gaussian process with time-varying mean and variance. Based on the degradation model, an optimization algorithm is devised to determine the best maintenance policy such that production loss due to equipment failures is minimized. Simulations and numerical examples are provided to demonstrate the performance of the method.

Keywords

Gaussian processes; maintenance engineering; optimisation; testing; best maintenance policy; condition-based equipment maintenance; condition-based maintenance program; degradation model; degradation signal; device testing cost; equipment failure; nonstationary Gaussian process; optimization algorithm; production loss; self-diagnostic data; time-varying mean; Automatic testing; Cost function; Degradation; Fabrication; Gaussian processes; Intelligent sensors; Lean production; Numerical simulation; Semiconductor device manufacture; Signal processing; Condition-based maintenance (CBM); electronics prognostics; nonstationary Gaussian process; remaining useful life;

fLanguage

English

Journal_Title

Automation Science and Engineering, IEEE Transactions on

Publisher

ieee

ISSN

1545-5955

Type

jour

DOI

10.1109/TASE.2010.2046164

Filename

5447813