• DocumentCode
    1473397
  • Title

    Prediction of electrical performance of medium voltage epoxy insulated equipment

  • Author

    Iyer, G. ; Gorur, R.S. ; Krivda, A. ; Mahonen, P.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    17
  • Issue
    2
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    334
  • Lastpage
    342
  • Abstract
    The paper presents a theoretical model based on the 2-parameter Weibull Distribution to predict the performance of cycloaliphatic based medium voltage (< 100 kV) insulation equipment. The model combines two prominent modes of degradation, namely surface damage (tracking and erosion) and flashover. New samples and samples that were aged in service and in outdoor test sites were evaluated. The flashover model is based on evaluating surface resistance under wet conditions. The degradation model is based on evaluating the tracking and erosion resistance in the Inclined Plane (ASTM D2303) test. The predictions of the model are shown to be in good agreement with experimental results. A total of 20 insulators and instrument transformers (new and field-aged) were evaluated.
  • Keywords
    Weibull distribution; ageing; epoxy insulation; equipment evaluation; flashover; instrument transformers; insulator contamination; insulator testing; ASTM D2303; Weibull distribution; cycloaliphatic based medium voltage insulation equipment; electrical performance prediction; erosion damage; flashover; inclined plane test; instrument transformer; medium voltage epoxy insulated equipment; polymeric insulators; surface damage; surface resistance; tracking damage; wet condition; Aging; Degradation; Dielectrics and electrical insulation; Flashover; Insulation life; Medium voltage; Predictive models; Surface resistance; Testing; Weibull distribution; Polymeric insulators, surface resistance, flashover, ESDD, inclined plane tracking test.;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2010.5448086
  • Filename
    5448086