DocumentCode
1473478
Title
Pattern definition employing prism-based deep ultraviolet lithography
Author
Sidharthan, R. ; Murukeshan, V.M.
Author_Institution
Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume
6
Issue
3
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
109
Lastpage
112
Abstract
Interferometric lithography provides a simple, cost-effective technique for the fabrication of large-area submicrometre periodic features. Biprism-based interferometric lithography employing a deep ultraviolet (DUV) light source is investigated for defining periodic patterns in large area with sub-500 nm pitch and sub-200 nm resolution. Collimated DUV light along with biprism with an angle of 30.4 was employed to fabricate grating lines using single exposure and square lattice features using double-exposure technique. Pyramidal prism was also employed to fabricate holes in square lattice using single exposure. Pitch size of around 410 nm and minimum feature size of 190 nm were realised employing this technique.
Keywords
diffraction gratings; optical fabrication; optical prisms; periodic structures; ultraviolet lithography; biprism-based interferometric lithography; collimated DUV light; deep ultraviolet light source; double-exposure technique; grating lines; pattern definition; prism-based deep ultraviolet lithography; pyramidal prism; square lattice features;
fLanguage
English
Journal_Title
Micro & Nano Letters, IET
Publisher
iet
ISSN
1750-0443
Type
jour
DOI
10.1049/mnl.2010.0196
Filename
5732720
Link To Document