DocumentCode :
1473790
Title :
A dual-page programming scheme for high-speed multigigabit-scale NAND flash memories
Author :
Takeuchi, Ken ; Tanaka, Tomoharu
Author_Institution :
Memory LSI Res. & Dev. Center, Toshiba Corp., Yokohama, Japan
Volume :
36
Issue :
5
fYear :
2001
fDate :
5/1/2001 12:00:00 AM
Firstpage :
744
Lastpage :
751
Abstract :
To realize a low-cost and high-speed programming NAND flash memory, a new programming scheme, a “dual-page programming scheme,” has been proposed. This architecture drastically increases the program throughput without circuit area overhead. In the proposed scheme, two memory cells are programmed at the same time using only one page buffer. Therefore, the page size, i.e., the number of memory cells programmed simultaneously, is doubled and the program speed is improved. As the number of page buffers required in the proposed scheme is the same as that in the conventional one, there is no circuit area increase. This novel operation is made possible by using a bitline as a dynamic latch to temporarily store the program data. As a result, the programming is accelerated by 73% in a 1-Gb generation and 62% in a 4-Gb generation, 18.2-MB/s 1-Gb or 30.7-MB/s 4-Gb NAND flash memory can be realized with this new architecture
Keywords :
NAND circuits; PLD programming; cellular arrays; flash memories; high-speed integrated circuits; memory architecture; 1 Gbit; 18.2 MB/s; 30.7 MB/s; 4 Gbit; circuit area increase; circuit area overhead; dual-page programming scheme; dynamic latch; high-speed multigigabit-scale NAND flash memories; memory architecture; memory cells; program throughput; Acceleration; Circuits; Digital audio players; Digital cameras; Dynamic programming; Electric breakdown; Flash memory; Helium; Latches; Throughput;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.918911
Filename :
918911
Link To Document :
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