Title :
Discussion of "Impact of subcycle transfer switches on distribution system reliability" [and reply]
Author :
Jipping, J.E. ; Carter, William E. ; Brown, Richard E. ; Ochoa, J.R.
Author_Institution :
Detroit Edison Co., MI, USA
Abstract :
J.E. Jipping et al. comment on the paper by R.E. Brown et al. (see ibid., vol.15, no.1, p.442-7, 2000). They point out that the effect of voltage sags should be considered in reliability models. The original authors reply to the comments.
Keywords :
power distribution reliability; power supply quality; switching; distribution system reliability; subcycle transfer switches; voltage sags; Circuit breakers; Circuit faults; Circuit testing; Power quality; Power system modeling; Power system reliability; Sociotechnical systems; Switches; System testing; Voltage fluctuations;
Journal_Title :
Power Systems, IEEE Transactions on
