Title :
OOF: an image-based finite-element analysis of material microstructures
Author :
Langer, Stephen A. ; Fuller, Edwin R., Jr. ; Carter, W. Craig
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Determining a material´s macroscopic properties given its microscopic structure is of fundamental importance to materials science. The authors describe two public-domain programs that jointly predict macroscopic behavior: OOF (Object-Oriented Finite elements) and ppm2oof (Portable Pixel Map to OOF format translator). The programs start from an image of the microstructure and end with results from finite-element calculations
Keywords :
crystal microstructure; electronic data interchange; finite element analysis; image processing; materials properties; materials science; object-oriented programming; physics computing; public domain software; OOF; Portable Pixel Map; finite element calculations; format translator; image-based finite-element analysis; macroscopic behaviour prediction; material macroscopic properties; material microstructures; materials science; object-oriented finite elements; ppm2oof; public-domain programs; Conducting materials; Crystal microstructure; Crystalline materials; Crystallization; Finite element methods; Image analysis; Magnetic materials; Materials science and technology; Object oriented modeling; Physics computing;
Journal_Title :
Computing in Science & Engineering
DOI :
10.1109/5992.919261
