Title :
Parallel Time-Domain Finite-Element Simulator of Linear Speedup and Electromagnetic Accuracy for the Simulation of Die–Package Interaction
Author :
Chen, Duo ; Jiao, Dan ; Koh, Cheng-Kok
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fDate :
5/1/2011 12:00:00 AM
Abstract :
In this paper, we develop an almost embarrassingly parallel solution to an electromagnetic solver of linear complexity for overcoming the grand challenge of performing electromagnetically accurate co-simulation of die-package interaction. In this solution, through suitable basis functions and linear algebraic techniques, we directly and rigorously decompose the system matrix in a 3-D space to multiple matrices of 1-D sizes with negligible computational overhead. Each 1-D matrix is made tridiagonal and, hence, can be solved readily in linear complexity. We then achieve an almost embarrassingly parallel implementation of the fast electromagnetic solver with a low communication-to-computation ratio. Numerical experiments on a large-scale combined die-package system, involving more than 3.5 billion unknowns, have demonstrated superior performance of the proposed parallel transient simulator for simulating large-scale integrated circuits and package problems. In addition, the proposed solver is applicable to any arbitrarily shaped multilayer structure embedded in inhomogeneous materials.
Keywords :
finite element analysis; integrated circuit packaging; large scale integration; matrix decomposition; time-domain analysis; communication-to-computation ratio; die-package interaction; electromagnetic accuracy; electromagnetic solver; large-scale integrated circuit; linear algebraic technique; linear complexity; linear speedup; matrix decomposition; parallel time-domain finite-element simulator; parallel transient simulator; Complexity theory; Electromagnetics; Integrated circuit modeling; Matrix decomposition; Nickel; Vectors; Electromagnetic analysis; finite-element methods; multicore; on-chip; package; parallel computing; transient simulation;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2011.2111418